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SRAMs have been widely adopted in various aerospace electronic systems
systems, and play an important role in the delay, area, power and criticality
Reliability In aerospace applications, SRAMs have a fundamental limit
this constitutes a challenge in the reliability induced by energy particles.
Therefore, disturbed individual events (SEUs) represent a serious reliability error
mechanism that can cause a malfunction of an electronic system
override the stored value. When the load
the particle hits a sensitive node of an integrated circuit, the armor
cargo along your way you can collect and accumulate efficiently
through drift processes. Once a transient voltage pulse is generated
of the accumulated load is above the switching threshold of the
circuit, the value stored in this sensitive node will be changed.

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